An Empirical Study of Pairwise Test Set Generation Using a Genetic Algorithm - researchr publication authors

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James D. McCaffrey. An Empirical Study of Pairwise Test Set Generation Using a Genetic Algorithm. In Shahram Latifi, editor, Seventh International Conference on Information Technology: New Generations, ITNG 2010, Las Vegas, Nevada, USA, 12-14 April 2010. pages 992-997, IEEE Computer Society, 2010. [doi]

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