James D. McCaffrey. An Empirical Study of Pairwise Test Set Generation Using a Genetic Algorithm. In Shahram Latifi, editor, Seventh International Conference on Information Technology: New Generations, ITNG 2010, Las Vegas, Nevada, USA, 12-14 April 2010. pages 992-997, IEEE Computer Society, 2010. [doi]
@inproceedings{McCaffrey10,
title = {An Empirical Study of Pairwise Test Set Generation Using a Genetic Algorithm},
author = {James D. McCaffrey},
year = {2010},
doi = {10.1109/ITNG.2010.93},
url = {http://doi.ieeecomputersociety.org/10.1109/ITNG.2010.93},
tags = {empirical, testing},
researchr = {https://researchr.org/publication/McCaffrey10},
cites = {0},
citedby = {0},
pages = {992-997},
booktitle = {Seventh International Conference on Information Technology: New Generations, ITNG 2010, Las Vegas, Nevada, USA, 12-14 April 2010},
editor = {Shahram Latifi},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3984-3},
}