Ryan McDowell, Ryan N. Rakvic, Hau T. Ngo, T. Owens Walker, Robert W. Ives, Dane Brown. Using Current Draw Analysis to Identify Suspicious Firmware Behavior in Solid State Drives. In Meikang Qiu, editor, 2019 IEEE International Conference on Computational Science and Engineering, CSE 2019, and IEEE International Conference on Embedded and Ubiquitous Computing, EUC 2019, New York, NY, USA, August 1-3, 2019. pages 92-97, IEEE, 2019. [doi]
Abstract is missing.