Fintan McGee, Bertjan Broeksema, Benoît Otjacques. VAST Challenge MC1: An off the shelf approach to messy data. In Min Chen, David S. Ebert, Chris North, editors, 2014 IEEE Conference on Visual Analytics Science and Technology, VAST 2014, Paris, France, October 25-31, 2014. pages 379-380, IEEE, 2014. [doi]
Abstract is missing.