Christopher D. McGuinness, Eric J. Balster, Frank A. Scarpino. Comparison of DEM and BEET linearization techniques for flash analog-to-digital converters using a SFDR metric. In 17th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2010, Athens, Greece, 12-15 December, 2010. pages 871-877, IEEE, 2010. [doi]
@inproceedings{McGuinnessBS10,
title = {Comparison of DEM and BEET linearization techniques for flash analog-to-digital converters using a SFDR metric},
author = {Christopher D. McGuinness and Eric J. Balster and Frank A. Scarpino},
year = {2010},
doi = {10.1109/ICECS.2010.5724651},
url = {http://dx.doi.org/10.1109/ICECS.2010.5724651},
researchr = {https://researchr.org/publication/McGuinnessBS10},
cites = {0},
citedby = {0},
pages = {871-877},
booktitle = {17th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2010, Athens, Greece, 12-15 December, 2010},
publisher = {IEEE},
isbn = {978-1-4244-8155-2},
}