Christopher D. McGuinness, Eric J. Balster, Frank A. Scarpino. Comparison of DEM and BEET linearization techniques for flash analog-to-digital converters using a SFDR metric. In 17th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2010, Athens, Greece, 12-15 December, 2010. pages 871-877, IEEE, 2010. [doi]
Abstract is missing.