Patrick M. McInerney, Juan M. Banda, Rafal A. Angryk. On Using SIFT Descriptors for Image Parameter Evaluation. In Wei Ding 0003, Takashi Washio, Hui Xiong, George Karypis, Bhavani M. Thuraisingham, Diane J. Cook, Xindong Wu, editors, 13th IEEE International Conference on Data Mining Workshops, ICDM Workshops, TX, USA, December 7-10, 2013. pages 32-39, IEEE Computer Society, 2013. [doi]
@inproceedings{McInerneyBA13,
title = {On Using SIFT Descriptors for Image Parameter Evaluation},
author = {Patrick M. McInerney and Juan M. Banda and Rafal A. Angryk},
year = {2013},
doi = {10.1109/ICDMW.2013.123},
url = {http://doi.ieeecomputersociety.org/10.1109/ICDMW.2013.123},
researchr = {https://researchr.org/publication/McInerneyBA13},
cites = {0},
citedby = {0},
pages = {32-39},
booktitle = {13th IEEE International Conference on Data Mining Workshops, ICDM Workshops, TX, USA, December 7-10, 2013},
editor = {Wei Ding 0003 and Takashi Washio and Hui Xiong and George Karypis and Bhavani M. Thuraisingham and Diane J. Cook and Xindong Wu},
publisher = {IEEE Computer Society},
}