Analysis of JPSS J1 VIIRS polarization sensitivity using the NIST T-SIRCUS

Jeffrey McIntire, James B. Young, David Moyer, Eugene Waluschka, Hassan Oudrari, Xiaoxiong Xiong. Analysis of JPSS J1 VIIRS polarization sensitivity using the NIST T-SIRCUS. In James J. Butler, Xiaoxiong (Jack) Xiong, Xingfa Gu, editors, Earth Observing Systems XX, SPIE Optical Engineering + Applications, San Diego, California, United States, 9-13 August 2015. Volume 9607 of SPIE Proceedings, pages 960713, SPIE, 2015. [doi]

Abstract

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