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Programmed test patterns for multiterminal devices

Francis J. McIntosh, W. W. Happ. Programmed test patterns for multiterminal devices. In American Federation of Information Processing Societies: AFIPS Conference Proceedings: 1969 Spring Joint Computer Conference, Boston, MA, USA, May 14-16, 1969. Volume 34 of AFIPS Conference Proceedings, pages 229-240, AFIPS Press, 1969. [doi]

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