Enhanced testing of clock faults - researchr publication authors

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Teresa L. McLaurin, Rich Slobodnik, Kun-Han Tsai, Ana Keim. Enhanced testing of clock faults. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-9, IEEE, 2007. [doi]

This author has not been identified. Look up 'Teresa L. McLaurin' in GoogleThis author has not been identified. Look up 'Rich Slobodnik' in GoogleThis author has not been identified. Look up 'Kun-Han Tsai' in GoogleThis author has not been identified. Look up 'Ana Keim' in Google

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