Teresa L. McLaurin, Rich Slobodnik, Kun-Han Tsai, Ana Keim. Enhanced testing of clock faults. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-9, IEEE, 2007. [doi]
Abstract is missing.