The Effects of Backdriving Integrated Circuits : An Accurate Electro-Thermal Model

Jill M. McPhee. The Effects of Backdriving Integrated Circuits : An Accurate Electro-Thermal Model. In Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985. pages 518-522, IEEE Computer Society, 1985.

Authors

Jill M. McPhee

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