J. W. McPherson. Time dependent dielectric breakdown physics - Models revisited. Microelectronics Reliability, 52(9-10):1753-1760, 2012. [doi]
@article{McPherson12, title = {Time dependent dielectric breakdown physics - Models revisited}, author = {J. W. McPherson}, year = {2012}, doi = {10.1016/j.microrel.2012.06.007}, url = {http://dx.doi.org/10.1016/j.microrel.2012.06.007}, researchr = {https://researchr.org/publication/McPherson12}, cites = {0}, citedby = {0}, journal = {Microelectronics Reliability}, volume = {52}, number = {9-10}, pages = {1753-1760}, }