J. W. McPherson. Time dependent dielectric breakdown physics - Models revisited. Microelectronics Reliability, 52(9-10):1753-1760, 2012. [doi]
@article{McPherson12,
title = {Time dependent dielectric breakdown physics - Models revisited},
author = {J. W. McPherson},
year = {2012},
doi = {10.1016/j.microrel.2012.06.007},
url = {http://dx.doi.org/10.1016/j.microrel.2012.06.007},
researchr = {https://researchr.org/publication/McPherson12},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {52},
number = {9-10},
pages = {1753-1760},
}