Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
J. W. McPherson. Time dependent dielectric breakdown physics - Models revisited. Microelectronics Reliability, 52(9-10):1753-1760, 2012. [doi]
No references recorded for this publication.
No citations of this publication recorded.