J. W. McPherson. Brief history of JEDEC qualification standards for silicon technology and their applicability(?) to WBG semiconductors. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 3, IEEE, 2018. [doi]
@inproceedings{McPherson18, title = {Brief history of JEDEC qualification standards for silicon technology and their applicability(?) to WBG semiconductors}, author = {J. W. McPherson}, year = {2018}, doi = {10.1109/IRPS.2018.8353556}, url = {https://doi.org/10.1109/IRPS.2018.8353556}, researchr = {https://researchr.org/publication/McPherson18}, cites = {0}, citedby = {0}, pages = {3}, booktitle = {IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018}, publisher = {IEEE}, isbn = {978-1-5386-5479-8}, }