A low-area filter bank design methodology for on-chip ADC testing - researchr publication authors

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Nicolas Mechouk, Dominique Dallet, Lilian Bossuet, Bertrand Le Gal. A low-area filter bank design methodology for on-chip ADC testing. In 17th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2010, Athens, Greece, 12-15 December, 2010. pages 718-721, IEEE, 2010. [doi]

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