Nicolas Mechouk, Dominique Dallet, Lilian Bossuet, Bertrand Le Gal. A low-area filter bank design methodology for on-chip ADC testing. In 17th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2010, Athens, Greece, 12-15 December, 2010. pages 718-721, IEEE, 2010. [doi]
@inproceedings{MechoukDBG10,
title = {A low-area filter bank design methodology for on-chip ADC testing},
author = {Nicolas Mechouk and Dominique Dallet and Lilian Bossuet and Bertrand Le Gal},
year = {2010},
doi = {10.1109/ICECS.2010.5724613},
url = {http://dx.doi.org/10.1109/ICECS.2010.5724613},
researchr = {https://researchr.org/publication/MechoukDBG10},
cites = {0},
citedby = {0},
pages = {718-721},
booktitle = {17th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2010, Athens, Greece, 12-15 December, 2010},
publisher = {IEEE},
isbn = {978-1-4244-8155-2},
}