Muralidhar Medidi, A. Sagahyroon. A Parallel Algorithm for VLSI Test Generation. In M. H. Hamza, editor, Proceedings of the Seventh IASTED/ISMM International Conference on Parallel and Distributed Computing and Systems, Washington, D.C., USA, October 19-21, 1995. pages 280-282, IASTED/ACTA Press, 1995.
@inproceedings{MedidiS95,
title = {A Parallel Algorithm for VLSI Test Generation},
author = {Muralidhar Medidi and A. Sagahyroon},
year = {1995},
tags = {testing},
researchr = {https://researchr.org/publication/MedidiS95},
cites = {0},
citedby = {0},
pages = {280-282},
booktitle = {Proceedings of the Seventh IASTED/ISMM International Conference on Parallel and Distributed Computing and Systems, Washington, D.C., USA, October 19-21, 1995},
editor = {M. H. Hamza},
publisher = {IASTED/ACTA Press},
}