José E. Medina-Pagola, Ansel Y. Rodríguez González, Abdel Hechavarría Díaz. Formal Distance vs. Association Strength in Text Processing. In Luis Rueda, Domingo Mery, Josef Kittler, editors, Progress in Pattern Recognition, Image Analysis and Applications, 12th Iberoamericann Congress on Pattern Recognition, CIARP 2007, Valparaiso, Chile, November 13-16, 2007, Proceedings. Volume 4756 of Lecture Notes in Computer Science, pages 930-939, Springer, 2007. [doi]
Abstract is missing.