Maximum Likelihood Sequence Detection of a Bit-stuffed Data Source - researchr publication authors

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Tim Meehan, James E. Hicks, Frank Kragh. Maximum Likelihood Sequence Detection of a Bit-stuffed Data Source. In Proceedings of IEEE International Conference on Communications, ICC 2006, Istanbul, Turkey, 11-15 June 2006. pages 1514-1519, IEEE, 2006. [doi]

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