Tim Meehan, James E. Hicks, Frank Kragh. Maximum Likelihood Sequence Detection of a Bit-stuffed Data Source. In Proceedings of IEEE International Conference on Communications, ICC 2006, Istanbul, Turkey, 11-15 June 2006. pages 1514-1519, IEEE, 2006. [doi]
@inproceedings{MeehanHK06,
title = {Maximum Likelihood Sequence Detection of a Bit-stuffed Data Source},
author = {Tim Meehan and James E. Hicks and Frank Kragh},
year = {2006},
doi = {10.1109/ICC.2006.255025},
url = {http://dx.doi.org/10.1109/ICC.2006.255025},
researchr = {https://researchr.org/publication/MeehanHK06},
cites = {0},
citedby = {0},
pages = {1514-1519},
booktitle = {Proceedings of IEEE International Conference on Communications, ICC 2006, Istanbul, Turkey, 11-15 June 2006},
publisher = {IEEE},
isbn = {1-4244-0355-3},
}