Mahmoud Mehrabankhomartash, Shiyuan Yin, Alfonso J. Cruz, Lukas Graber, Maryam Saeedifard, Simon Evans, Florian Kapaun, Ivan Revel, Gerhard Steiner, Ludovic Ybanez, Chanyeop Park. Static and Dynamic Characterization of 1200 V SiC MOSFETs at Room and Cryogenic Temperatures. In IECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society, Toronto, ON, Canada, October 13-16, 2021. pages 1-6, IEEE, 2021. [doi]
Abstract is missing.