Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Kolsoom Mehrabi, Behzad Ebrahimi, Roohollah Yarmand, Ali Afzali-Kusha, Hamid Mahmoodi. Read static noise margin aging model considering SBD and BTI effects for FinFET SRAMs. Microelectronics Reliability, 65:20-26, 2016. [doi]
Abstract is missing.