Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology

Vishal J. Mehta, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski. Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-10, IEEE, 2006. [doi]

Authors

Vishal J. Mehta

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Malgorzata Marek-Sadowska

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Kun-Han Tsai

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Janusz Rajski

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