A 77 MHz Relaxation Oscillator in 5nm FinFET with 3ns TIE over 10K cycles and ±0.3% Thermal Stability using Frequency-Error Feedback Loop

Nandish Mehta, Stephen G. Tell, Walker J. Turner, Lamar Tatro, Giant Goh, C. Thomas Gray. A 77 MHz Relaxation Oscillator in 5nm FinFET with 3ns TIE over 10K cycles and ±0.3% Thermal Stability using Frequency-Error Feedback Loop. In IEEE Asian Solid-State Circuits Conference, A-SSCC 2021, Busan, Korea, Republic of, November 7-10, 2021. pages 1-3, IEEE, 2021. [doi]

@inproceedings{MehtaTTTGG21,
  title = {A 77 MHz Relaxation Oscillator in 5nm FinFET with 3ns TIE over 10K cycles and ±0.3% Thermal Stability using Frequency-Error Feedback Loop},
  author = {Nandish Mehta and Stephen G. Tell and Walker J. Turner and Lamar Tatro and Giant Goh and C. Thomas Gray},
  year = {2021},
  doi = {10.1109/A-SSCC53895.2021.9634712},
  url = {https://doi.org/10.1109/A-SSCC53895.2021.9634712},
  researchr = {https://researchr.org/publication/MehtaTTTGG21},
  cites = {0},
  citedby = {0},
  pages = {1-3},
  booktitle = {IEEE Asian Solid-State Circuits Conference, A-SSCC 2021, Busan, Korea, Republic of, November 7-10, 2021},
  publisher = {IEEE},
  isbn = {978-1-6654-4350-0},
}