Jie Mei, Lijie Li, Steve Wilks. Impact on the electrostatic field of electrostatic force microscope due to tip-sample distance and non-flat sample surface. In 38th Annual Conference on IEEE Industrial Electronics Society, IECON 2012, Montreal, QC, Canada, October 25-28, 2012. pages 3966-3969, IEEE, 2012. [doi]
Abstract is missing.