Kristof Meixner, Dietmar Winkler 0001, Stefan Biffl. Supporting Domain Experts by using Model-Based Equivalence Class Partitioning for Efficient Test Data Generation. In 24th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2019, Zaragoza, Spain, September 10-13, 2019. pages 134-141, IEEE, 2019. [doi]
Abstract is missing.