Kristof Meixner, Lukas Kathrein, Dietmar Winkler 0001, Arndt Lüder, Stefan Biffl. Efficient Test Case Generation from Product and Process Model Properties and Preconditions. In 25th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2020, Vienna, Austria, September 8-11, 2020. pages 859-866, IEEE, 2020. [doi]
Abstract is missing.