Defects Detection by Approximation, Multilevel Segmentation and Comparison of Samples - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Roman Melnyk, Ruslan Tushnytskyy, Yurii Havrylko. Defects Detection by Approximation, Multilevel Segmentation and Comparison of Samples. In IEEE 15th International Conference on Computer Sciences and Information Technologies, CSIT 2020, Zbarazh, Ukraine, September 23-26, 2020 - Volume 1. pages 1-4, IEEE, 2020. [doi]

This author has not been identified. Look up 'Roman Melnyk' in GoogleThis author has not been identified. Look up 'Ruslan Tushnytskyy' in GoogleThis author has not been identified. Look up 'Yurii Havrylko' in Google

runs on WebDSL