Roman Melnyk, Ruslan Tushnytskyy, Yurii Havrylko. Defects Detection by Approximation, Multilevel Segmentation and Comparison of Samples. In IEEE 15th International Conference on Computer Sciences and Information Technologies, CSIT 2020, Zbarazh, Ukraine, September 23-26, 2020 - Volume 1. pages 1-4, IEEE, 2020. [doi]
Abstract is missing.