Thilo Mende, Felix Beckwermert, Rainer Koschke, Gerald Meier. Supporting the Grow-and-Prune Model in Software Product Lines Evolution Using Clone Detection. In 12th European Conference on Software Maintenance and Reengineering, CSMR 2008, April 1-4, 2008, Athens, Greece. pages 163-172, IEEE, 2008. [doi]
Abstract is missing.