Diogo Silveira Mendonça, Marcos Kalinowski. Towards Practical Reuse of Custom Static Analysis Rules for Defect Localization. In Davi Viana, Marcelo Schots, editors, 19th Brazilian Symposium on Software Quality, SBQS 2020, São Luís, Brazil, December, 2020. pages 24, ACM, 2020. [doi]
Abstract is missing.