MarcÃlio Mendonça, Andrzej Wasowski, Krzysztof Czarnecki. SAT-based analysis of feature models is easy. In Dirk Muthig, John D. McGregor, editors, Software Product Lines, 13th International Conference, SPLC 2009, San Francisco, California, USA, August 24-28, 2009, Proceedings. Volume 446 of ACM International Conference Proceeding Series, pages 231-240, ACM, 2009. [doi]
Abstract is missing.