Positive and negative threshold voltage instabilities in GaN-based transistors

Gaudenzio Meneghesso, Matteo Meneghini, Carlo De Santi, Maria Ruzzarin, Enrico Zanoni. Positive and negative threshold voltage instabilities in GaN-based transistors. Microelectronics Reliability, 80:257-265, 2018. [doi]

Abstract

Abstract is missing.