Matteo Meneghini, Matteo Dal Lago, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni. Chip and package-related degradation of high power white LEDs. Microelectronics Reliability, 52(5):804-812, 2012. [doi]
Abstract is missing.