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ESD degradation and robustness of RGB LEDs and modules: An investigation based on combined electrical and optical measurements

Matteo Meneghini, Simone Vaccari, Matteo Dal Lago, Stefano Marconi, Marco Barbato, Nicola Trivellin, Alessio Griffoni, Alberto Alfier, Giovanni Verzellesi, Gaudenzio Meneghesso, Enrico Zanoni. ESD degradation and robustness of RGB LEDs and modules: An investigation based on combined electrical and optical measurements. Microelectronics Reliability, 54(6-7):1143-1149, 2014. [doi]

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Matteo Meneghini

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Simone Vaccari

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Matteo Dal Lago

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Stefano Marconi

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Marco Barbato

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Nicola Trivellin

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Alessio Griffoni

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Alberto Alfier

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Giovanni Verzellesi

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Gaudenzio Meneghesso

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Enrico Zanoni

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