Characterization of MIS structures and PTFTs using TiOx deposited by spin-coating

C. Meneses, J. G. Sánchez, M. Estrada, Antonio Cerdeira, Josep Pallarés, Benjamín Iñiguez, Lluís F. Marsal. Characterization of MIS structures and PTFTs using TiOx deposited by spin-coating. Microelectronics Reliability, 54(5):893-898, 2014. [doi]

Abstract

Abstract is missing.