Nonlinear Correction Method for Si Photodiode Detectors and Its Application to the Electro-Optical Measurement for the PDLC Film

Xiangshen Meng, Jian Li, Yueqiang Lin, Xiaodong Liu, Decai Li, Zhenghong He. Nonlinear Correction Method for Si Photodiode Detectors and Its Application to the Electro-Optical Measurement for the PDLC Film. IEEE T. Instrumentation and Measurement, 72:1-6, 2023. [doi]

Abstract

Abstract is missing.