An improved procedure to test CMOS ICs for latch-up - researchr publication authors

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Roberto Menozzi, Mattia Lanzoni, Luca Selmi, Bruno Riccò. An improved procedure to test CMOS ICs for latch-up. In Proceedings IEEE International Test Conference 1990, Washington, D.C., USA, September 10-14, 1990. pages 1028-1034, IEEE Computer Society, 1990. [doi]

This author has not been identified. Look up 'Roberto Menozzi' in GoogleThis author has not been identified. Look up 'Mattia Lanzoni' in GoogleThis author has not been identified. It may be one of the following persons:

Luca Selmi

Look up 'Luca Selmi' in GoogleThis author has not been identified. Look up 'Bruno Riccò' in Google

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