Roberto Menozzi, Mattia Lanzoni, Luca Selmi, Bruno Riccò. An improved procedure to test CMOS ICs for latch-up. In Proceedings IEEE International Test Conference 1990, Washington, D.C., USA, September 10-14, 1990. pages 1028-1034, IEEE Computer Society, 1990. [doi]
@inproceedings{MenozziLSR90,
title = {An improved procedure to test CMOS ICs for latch-up},
author = {Roberto Menozzi and Mattia Lanzoni and Luca Selmi and Bruno Riccò},
year = {1990},
doi = {10.1109/TEST.1990.114126},
url = {http://dx.doi.org/10.1109/TEST.1990.114126},
researchr = {https://researchr.org/publication/MenozziLSR90},
cites = {0},
citedby = {0},
pages = {1028-1034},
booktitle = {Proceedings IEEE International Test Conference 1990, Washington, D.C., USA, September 10-14, 1990},
publisher = {IEEE Computer Society},
isbn = {0-8186-9064-},
}