Robert G. Merkel, Fei-Ching Kuo, Tsong Yueh Chen. An Analysis of Failure-Based Test Profiles for Random Testing. In Proceedings of the 35th Annual IEEE International Computer Software and Applications Conference, COMPSAC 2011, Munich, Germany, 18-22 July 2011. pages 68-75, IEEE Computer Society, 2011. [doi]
Abstract is missing.