Ankush Meshram, Markus Karch, Christian Haas 0005, Jürgen Beyerer. Towards Graph-based Self-learning of Industrial Process Behaviour for Anomaly Detection. In Yen-Wei Chen 0001, Robert J. Howlett, Lakhmi C. Jain, editors, Knowledge-Based and Intelligent Information & Engineering Systems: Proceedings of the 29th International Conference KES-2025, Osaka, Japan, 10-12 September 2025. Volume 270 of Procedia Computer Science, pages 3913-3923, Elsevier, 2025. [doi]
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