Evaluation of Electron Scattering in High-Resolution X-Ray Mask Fabrication

G. Messina, A. Paoletti, S. Santangelo, A. Tucciarone. Evaluation of Electron Scattering in High-Resolution X-Ray Mask Fabrication. In Franco Maceri, Giuseppe Iazeolla, editors, Eurosim 1992, Simulation Congress, Proceedings of the 1992 EUROSIM Conference, Capri, Italy, September 28 - October 4, 1992. pages 497-504, Elsevier, 1992.

Abstract

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