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Mohamed Metwally, Nicholai L'Esperance, Tian Xia, Mustapha Slamani. Continuous wave radar circuitry testing using OFDM technique. In IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014. pages 1-6, IEEE, 2014. [doi]