Manan Mewada, Mazad Zaveri. An input test pattern for characterization of a full-adder and n-bit ripple carry adder. In 2016 International Conference on Advances in Computing, Communications and Informatics, ICACCI 2016, Jaipur, India, September 21-24, 2016. pages 250-255, IEEE, 2016. [doi]
@inproceedings{MewadaZ16, title = {An input test pattern for characterization of a full-adder and n-bit ripple carry adder}, author = {Manan Mewada and Mazad Zaveri}, year = {2016}, doi = {10.1109/ICACCI.2016.7732055}, url = {http://dx.doi.org/10.1109/ICACCI.2016.7732055}, researchr = {https://researchr.org/publication/MewadaZ16}, cites = {0}, citedby = {0}, pages = {250-255}, booktitle = {2016 International Conference on Advances in Computing, Communications and Informatics, ICACCI 2016, Jaipur, India, September 21-24, 2016}, publisher = {IEEE}, isbn = {978-1-5090-2029-4}, }