Manan Mewada, Mazad Zaveri. An input test pattern for characterization of a full-adder and n-bit ripple carry adder. In 2016 International Conference on Advances in Computing, Communications and Informatics, ICACCI 2016, Jaipur, India, September 21-24, 2016. pages 250-255, IEEE, 2016. [doi]
Abstract is missing.