Fernand Meyer, Jean Stawiaski. A Stochastic Evaluation of the Contour Strength. In Michael Goesele, Stefan Roth, Arjan Kuijper, Bernt Schiele, Konrad Schindler, editors, Pattern Recognition - 32nd DAGM Symposium, Darmstadt, Germany, September 22-24, 2010. Proceedings. Volume 6376 of Lecture Notes in Computer Science, pages 513-522, Springer, 2010. [doi]
Abstract is missing.