Mariam El Mezouar, Feng Zhang 0001, Ying Zou. Local versus global models for effort-aware defect prediction. In Marcellus Mindel, Blake Jones, Hausi A. Müller, Vio Onut, editors, Proceedings of the 26th Annual International Conference on Computer Science and Software Engineering, CASCON 2016, Toronto, Ontario, Canada, October 31 - November 2, 2016. pages 178-187, IBM / ACM, 2016. [doi]
Abstract is missing.