Ning Mi, Sheldon X.-D. Tan, Boyuan Yan. Multiple block structure-preserving reduced order modeling of interconnect circuits. Integration, 42(2):158-168, 2009. [doi]
@article{MiTY09,
title = {Multiple block structure-preserving reduced order modeling of interconnect circuits},
author = {Ning Mi and Sheldon X.-D. Tan and Boyuan Yan},
year = {2009},
doi = {10.1016/j.vlsi.2008.04.006},
url = {http://dx.doi.org/10.1016/j.vlsi.2008.04.006},
tags = {modeling},
researchr = {https://researchr.org/publication/MiTY09},
cites = {0},
citedby = {0},
journal = {Integration},
volume = {42},
number = {2},
pages = {158-168},
}