The failure-tolerant analog-digital converter with built-in means of self-checking and its modeling in the environment of LabVIEW

Seluyanov Michail. The failure-tolerant analog-digital converter with built-in means of self-checking and its modeling in the environment of LabVIEW. In 1st Mediterranean Conference on Embedded Computing, MECO 2012, Bar, Montenegro, June 19-21, 2012. pages 239-242, IEEE, 2012. [doi]

Abstract

Abstract is missing.